David Eppstein – Publications

C-planarity testing of embedded clustered graphs with bounded dual carving-width.
G. Da Lozzo, D. Eppstein, M. T. Goodrich, and S. Gupta.
arXiv:1910.02057.
Proc. 14th International Symposium on Parameterized and Exact Computation (IPEC 2019), Munich, Germany, 2019 (best paper award).
Leibniz International Proceedings in Informatics (LIPIcs) 148, 2019, pp. 9:1–9:17, doi:10.4230/LIPIcs.IPEC.2019.9.
Algorithmica 83 (8): 2471–2502, 2021 (special issue for IPEC 2019), doi:10.1007/s00453-021-00839-2.

We show that finding clustered planar drawings can be done in fixed-parameter-tractable time, depending only on a single width parameter of the input clustered graph.

(Blog post: Drawing clustered graphs of bounded width)