Associate professor of Informatics James Jones, along with co-authors Mary Jean Harrold and John Stasko, received an Impact Paper Award from ACM’s Special Interest Group on Software Engineering (SIGSOFT). Their paper, “Visualization of Test Information to Assist Fault Localization,” presents a color-coded visualization technique to help locate errors and faults in software. The paper originally appeared in the 2002 Proceedings of the 24th International Conference on Software Engineering (ICSE).
ACM SIGSOFT Impact Paper Awards are presented annually to authors of significantly influential papers published in SIGSOFT sponsored or co-sponsored conference proceedings at least a decade prior to the award year. Awardees receive a $1,000 honorarium to split among themselves, an award plaque for each author, an invitation for the authors to present a keynote talk at the SIGSOFT joint Foundations of Software Engineering (FSE) symposium and European Software Engineering Conference (ESEC), and inclusion of a full-length paper in the SIGSOFT conference proceedings. Jones accepted the award at the joint conference in Bergamo, Italy this September.
According to the website, “The ACM Special Interest Group on Software Engineering provides a forum for computing professionals from industry, government and academia to examine principles, practices, and new research results in software engineering.” The group holds several software engineering conferences and symposiums annually.
Jones’ research focuses on software testing, software analysis (run-time and compile-time) and debugging. He is particularly interested in supporting the creative and intellectual process of developing and maintaining software.